Process monitoring

Process monitoring

Our systems are based on an active principle that combines a terahertz emission source and a terahertz signal measuring sensor. The emitted wave propagates inside the material and is then captured by the sensor measuring its amplitude and polarisation; both these variables provide information on the internal properties of the material crossed.

Several analysis methods can be envisaged, mainly transmission and 0°/45° reflection.


The table below sets out the types of analysis that we can investigate:

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